方案摘要
方案下载| 应用领域 | 地矿 |
| 检测样本 | 非金属矿产 |
| 检测项目 | 痕量元素 |
| 参考标准 | - |
Non-destructive sample analysis with high spatial resolution can be very difficult to accomplish using conventional EDS detectors as sample surface charging, electron beam damage and shading effects by topography are common problems in scanning electron microscopy. The BRUKER XFlash® FlatQUAD silicon drift detector (SDD) overcomes these limitations. The special geometry with an annular arrangement of detector elements offers a very high solid angle [1]. The XFlash® FlatQUAD detector allows the use of ultra-low beam currents and the investigation of samples with complex topography as demonstrated on two meteorite fall samples.
The Mocs historic meteorite fell on February 2, 1882 in Hungary
[2]. The historically cut sample (Fig. 1a) was stored at Naturhistorisches Museum Wien (Natural History Museum, Vienna, Austria) for the last century. Studies recently carried out with the Bruker M4 TORNADO benchtop Micro-XRF spectrometer revealed an unexpected lead enrichment
along cracks (Fig. 1b). This finding led to a detailed analysis using the XFlash® FlatQUAD detector. The second study was carried out on a piece of the Tissint Martian meteorite
that fell in Morocco on July 18, 2011 [3]. Tissint is only the fifth Martian meteorite that people have witnessed falling to Earth, the last time such an event happened was in 1962. Thus, the scientific value of these unique meteorites excludes sample preparation.
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