Deep-LevelTransientSpectroscopy(DLTS)

2020-09-04 15:17  下载量:0

资料摘要

资料下载

Deep-level transient spectroscopy (DLTS) is a very powerful tool to detect the defect concentration and thermal emission rate of semiconductor deep levels by measuring capacitance transients as a function of temperature. It normally used the Schottky diode or p-n junction as a probe. In the process, the probe is forward biased to fill the defects with free carriers by a pulse voltage. After the pulse, the defects start emitting trapped carriers due to thermal emission.

资料下载

文献贡献者

相关资料 更多

相关产品

当前位置: 多为莱博 资料 Deep-LevelTransientSpectroscopy(DLTS)

关注

拨打电话

留言咨询