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产品概要：
The PHEMOSe-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by semiconductor device defects.
基本信息：
Since the PHEMOSe-X is usable in combination with a general-purpose prober,you can do various analysis tasks by using the sample setups you are already familiar with. Installing an optional laser scan system allows acquiring high-resolution pattern images. Different types of detectors are available for various analysis techniques such as emission analysis, thermal analysis, and IR-OBIRCH analysis. The PHEMOS-X supports a wide variety of tasks and applications ranging from prober socket boards to a large-size 300 mm wafer prober.
技术优势：
应用方向：
主要应用于失效分析、缺陷定位
180天
1年
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