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Optimal TEM specimen preparation done First Time Right
Achieve ultimate specimen quality – free from amorphous and implanted layers
Complements FIB technology
Milling without introduction of artifacts
Advanced detector technology for imaging and precise endpoint detection
In situ imaging with ions and electrons
Microscope connectivity for risk-free specimen handling
Adds capability and capacity
Fast, reliable and easy to use
1年
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有
免费现场培训
一年两次
保修期内人工与配件全包
24小时电话技术支持，如需上门3个工作日内到达用户现场
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