方案摘要
方案下载| 应用领域 | 能源/新能源 |
| 检测样本 | 太阳能电池 |
| 检测项目 | |
| 参考标准 | 无 |
An important part of the research and development of thin-film solar cells is the characterisation of microstructural and compositional properties of the functional layers. For this purpose, energy-dispersive X-ray spectrometry (EDS) and electron backscatter diffraction (EBSD) represent techniques which exhibit spatial resolutions on the nanometer scale but can be, at the same time, applied on large areas of several square millimeters. The application of EDS and EBSD is demonstrated on this example of thin-film solar cells with Cu(In,Ga)Se2 absorber layers. While EDS provides elemental distributions even in layers with a nominal thickness of 30-50 nm, EBSD gives not only information of average grain sizes, local orientations and grain boundaries. Moreover, strain distributions within individual grains can be calculated by the evaluation of EBSD patterns recorded on individual grains.
An important part of the research and development of thin-film solar cells is the characterisation of microstructural and
compositional properties of the functional layers. For this purpose, energy-dispersive X-ray spectrometry (EDS) and electron
backscatter diffraction (EBSD) represent techniques which exhibit spatial resolutions on the nanometer scale but can be, at
the same time, applied on large areas of several square millimeters. The application of EDS and EBSD is demonstrated on this
example of thin-film solar cells with Cu(In,Ga)Se2 absorber layers. While EDS provides elemental distributions even in layers
with a nominal thickness of 30-50 nm, EBSD gives not only information of average grain sizes, local orientations and grain
boundaries. Moreover, strain distributions within individual grains can be calculated by the evaluation of EBSD patterns recorded
on individual grains.
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