方案摘要
方案下载| 应用领域 | 石油/化工 |
| 检测样本 | 聚乙烯(PE) |
| 检测项目 | 理化分析 |
| 参考标准 | 无 |
The atomic force microscope (AFM) is a powerful tool for characterizing polymer materials. It provides nanoscale information on a wide range of physical properties and behaviour in addition to imaging morphology.
The atomic force microscope (AFM) is a powerful tool for characterizing polymer materials. It provides nanoscale information on a wide range of physical properties and behaviour in addition to imaging morphology. Whether investigating fundamental principles of polymer science or engineering a specific polymer solution (Figure 2), the AFM is a key instrument for evaluating polymers at small length scalesIts spatial resolution enables visualisation of sub-micrometer and sub-nanometer polymer morphology. But AFMs can contribute much more information about polymers besides simple topographic morphology, including probing molecular-level forces, mapping mechanical, thermal, and electrical properties and assessing solvent and thermal effects in near real time.
文献贡献者
一文了解 EDS 能谱技术发展历程
应用分享|红外辐射全无惧——牛津仪器新型高温 EDS / EBSD 助力原位分析
AZtecBattery 在锂离子电池清洁度检测中的应用
相关产品
牛津EMCCD探测器iXon Ultra 897
牛津EMCCD探测器iXon 888
日本电子JED能谱元素分析系统 AZtecTEM
透射电镜元素分析系统 牛津仪器能谱仪Xplore TEM
透射电镜元素分析系统 牛津仪器能谱仪UltimMax TLE
透射电镜元素分析系统 牛津仪器能谱仪UltimMax TEM
台式共聚焦显微镜BC43牛津仪器ANDOR
牛津仪器原子力显微镜 Cypher VRS1250
扫描电镜微量元素分析系统 牛津仪器波谱仪AZtecWave
Sona sCMOS 生命科学显微相机平台
用于天文学和物理科学的超灵敏背照式sCMOS相机
波长色散谱仪
电镜专用微区结构分析---牛津仪器全能型 S2 EBSD
牛津仪器Proteox5mK 稀释制冷机
牛津仪器快速扫描电容显微镜（SCM）
关注
拨打电话
留言咨询
