Analysing a NAND Flash memory device using low kV EDS

2020/06/15   下载量： 1 次

方案摘要

方案下载
应用领域 电子/电气
检测样本 其他
检测项目
参考标准 无

Introduction Historically energy dispersive X-ray spectroscopy has been focused towards high energies where X-ray lines are well separated and the X-ray background is low. Recently the demand for higher spatial resolution, whether that is when analysing semiconductor devices or measuring precipitates in metals, has increased dramatically. To ensure maximum sensitivity when working under these demanding conditions the Ultim® range of EDS detectors combine the largest area SDD with optimised geometries to consistently deliver a higher count rate.

方案下载
配置单
方案详情

Introduction

Historically energy dispersive X-ray spectroscopy has been focused towards high energies where X-ray lines are well separated

and the X-ray background is low. Recently the demand for higher spatial resolution, whether that is when analysing

semiconductor devices or measuring precipitates in metals, has increased dramatically. To ensure maximum sensitivity when

working under these demanding conditions the Ultim® range of EDS detectors combine the largest area SDD with optimised

geometries to consistently deliver a higher count rate.


上一篇 一文了解 EDS 能谱技术发展历程
下一篇 Detailed EBSD Study of a Bivalve SEhell

文献贡献者

牛津仪器科技（上海）有限公司
白金会员 丨 第23年
查看全部资料
推荐方案
更多

相关产品

当前位置： 仪器信息网 牛津仪器 方案 Analysing a NAND Flash memory device using low kV EDS

关注

拨打电话

留言咨询