Filippo Giannazzo (PhD) joined CNR-IMM in 2006, he is Senior Researcher from 2010 and Research Director from 2020. He is expert in scanning probe microscopy methods for the characterization of carrier transport properties in advanced materials for micro- and nanoelectronics (wide-bandgap semiconductors, heterostructures, dielectrics, 2D materials). Author of 320 papers, 10 book chapters and 2 books (H-index=39, 4660 citations, source Scopus) and an international patent, he is frequently invited speaker in national and international conferences. He holds several national and international collaborations with academic institutions and industries. Involved in several national and EU projects, he is currently coordinating the FlagERA JTC-2019 project ETMOS.