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Keynote talk: Conductive Atomic Force Microscopy of 2D Materials and Heterostructures for Nanoelectronics<br>主题报告：导电原子力显微镜及纳米电子学二维材料和异质结构研究

My presentation will provide an overview of conductive atomic force microscopy (C-AFM) applications to 2D materials for next generation micro- and nano- electronic devices, by discussing a number of relevant case studies: (i) the lateral homogeneity of current transport in graphene grown by CVD or by thermal decomposition of SiC; (ii) the Schottky barrier homogeneity of MoS2; (iii) the vertical current injection through 2D/3D or 2D/2D materials heterojunctions The results of the nanoscale electrical characterization will be correlated to device level measurements, thus providing an insight in the phenomena limiting the performances of 2D materials-based devices.

197 2020-12-30

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