Dr. Alok Ranjan is a postdoctoral research fellow at Engineering Product Development pillar at Singapore University of Technology and Design (SUTD). Alok’s research interest includes physical and failure analysis of emerging materials and nanoscale devices using scanning probe microscopy and electron microscopy techniques. Alok also contributes as a technical reviewer for various journals including Applied Physics Letters, Scientific Reports, ACS Applied Materials and Interfaces, IEEE Transactions of Materials Device and Reliability and Microelectronics Reliability.