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OPTREL GBR·STRASSE DER JUGEND 27-29 · D-14532 KLEINMACHNOW WWW.OPTREL.DE·OPTREL@T-ONLINE.DE Ellipsometry is a very sensitive measurement techniquethat uses polarized light to characterize thin films, sur-faces, and material microstructure. Usually the polariza-tion of light changes upon reflection. These changes aremeasured by an ellipsometer and interpreted on the basisof model calculations. The change in the state of polarization is the direct conse-quence of interference within the layer system. It is cap-tured by the so called ellipsometric angles ▲ and 亚. What information can beobtained? · Thicknesses with an accuracy in the sub-nm range ·Optical constants ● Orientation of molecules · Mass coverage at surfaces The data acquisition is sufficiently fast that the kineticsof adsorption processes can be studied. Ellipsometry is aversatile technology that has been used for over a century.The measurements are non-destructive and many samplework, even liquid-liquid interfaces are accessible. Ellipsometry can be used for a broad range of applications,common research areas are: · Assessment of scaling laws · Ion distribution ● Photochemistry Adsorption isotherms ·Adsorption kinetics ·Corrosion ● Characterization of thin films ·Glass transition in confined geometries · Determination of optical constants · Swelling experiments MULTISKOP - ELLIPSOMETRYMODULE The Multiskop performs ellipsometric measurements in avariety of different modes: · Multi-zone measurements ·Angle dependent ellipsometric reflection scans ● Kinetic runs The instrument and the software have been designed byscientists who are using these techniques in their own re-search. This ensures an ergonomic layout of the controland data evaluation software. The user receives an on-linecontrol about all decisive parameters as illustrated in thefollowing screenshot: The kinetic mode offers the possibility to record additionalexperimental parameters which may refer to temperature,surface tension, humidity or pH value. The external pa-rameters are simultaneously recorded with the ellipsomet-ric angles ▲ and亚. THE MULTISKOP comes with many useful accessories. Thefollowing list only some selected items. Automated x,y sample stage allows to scan big sur-face area. The analysis yields the topography of thesurface. Adsorption cells: The design of a proper cell is not triv-ial and requires some experience. It is important that thecell windows do not influence the measurement. The fol-lowing has to be considered: The beam should hit the windows at normal inci-dence because the state of polarization remains thenunchanged. ● Birefringence of the cell windows (thermal and me-chanical) stress must be avoided. · Multiple reflection should be avoided. All these requirements are met by our adsorption cell withwindows fixed at a certain angle of incidence. The cham-ber is made of Teflon. The cell can be hooked up to athermostat and a peristaltic pump. Angle dependent measurements are not feasible in thisarrangement.An interesting design has been reportedin J. Benjamins, B. Jonsson, K. Thuresson, T. Ny-lander New Experimental Setup To Use Ellipsome-try To Study Liquid-Liquid and Liquid-Solid Inter-faces Langmuir 2002,18,6437-6444. The experimen-tal problems have been overcome by fixing tubes on laserand detector-arm of the MULTISKOP. In this arrangementangle dependent measurements are feasible, the beam re-mains perpendicular to the cell window. This design isadvantageous if the solvent has a low vapour pressure.
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