植物中营养元素检测方案(ICP-AES)

智能文字提取功能测试中

Plant nutrient analysis using the Agilent 5100 Synchronous Vertical Dual View ICP OES Introduction The determination of the elemental composition in plants is important for development， growth and maintenanceof plant tissues. Elements， such as Al， B， Ba， Ca， Cu， Fe， K， Mg， Mn， S， Sr， P， and Zn， are important for plant nutrition，being vital nutrients required for tissue development， maintenance and plant metabolism [1]. The determinationof macro，micronutrients and contaminants in plant samples is important to keep up with sources of nutrients andminerals.The chemical analysis of plant materials can be applied to assist in the remediation of contaminated soilsor to solve mineral malnutrition， a problem that seriously affects the human population [2， 3]. Inductively coupledplasma optical emission spectrometry (ICP-OES) is an attractive technique for this analysis because it canaccommodate the wide concentration ranges typical of macro and micronutrients in plants. 2 Agronomicallaboratories typically deal with large batches of samples. Several critical elements， in wide concentration ranges，must be determined on a routine basis for such samples. The Agilent 5100 Synchronous Vertical Dual View (SVDV)ICP-OES with Dichroic Spectral Combiner (DSC) technology， has the ability to keep up with these demands，performing axial and radial measurements in a single reading， leading to faster sample throughput times. Withfaster sample run times， the 5100 SVDV requires less argon per sample， meaning significant savings can be madefor labs involved in high throughput analysis. The Vista Chip II detector used in the 5100 ICP-OES has the fastestprocessing speed (1 MHz) of any charge coupled device (CCD) detector used in ICP-OES. It delivers fast warm-up，high throughput， high sensitivity， and the largest dynamic range. This application note describes the quantitationof Al， B， Ba， Ca， Cu， Fe， K， Mg， Mn， P， S， Sr and Zn in microwave acid digested alfalfa， corn and sugarcane samplesand an apple leaves certified reference material (SRM NIST 1515)， using the Agilent 5100 Synchronous VerticalDual View (SVDV) ICP-OES. ·Agilent Technologies