醉卧古隆中 2008/03/01
RUGGERO CAMINITI, VALERIO ROSSI ALBERTINI The kinetics of phase transitions observed by energy-dispersive X-ray diffraction International Reviews in Physical Chemistry, Volume 18, Number 2, Pages 263-299 (April 1, 1999) [img]https://www.instrument.com.cn/bbs/images/affix.gif[/img][url=http://www.instrument.com.cn/bbs/download.asp?ID=80210]InternRevPhysChem18-263[/url]
我在故我思 2008/02/29
楼主,你好!找了一篇,您看看吧。 [img]https://www.instrument.com.cn/bbs/images/affix.gif[/img][url=http://www.instrument.com.cn/bbs/download.asp?ID=80107]X射线衍射物相分析在胶凝材料研究中的应用[/url]
zjchen3189 2008/02/29
X射线定量物相分析程序 你参考参考! [img]https://www.instrument.com.cn/bbs/images/affix.gif[/img][url=http://www.instrument.com.cn/bbs/download.asp?ID=80126]X射线定量物相分析程序[/url]
大陆 2008/02/29
[quote]原文由 [B]zouhua1210[/B] 发表: 这段时间要写这方面的文章,要找几篇比较好的综述文献做参考,在此恳请大家的帮助.[/quote] 贴几篇基本的论文. 更多资源请浏览http://prism.mit.edu/xray/resources.htm [1] B.D. Cullity, Elements of X-ray Diffraction, Addison-Wesley publishing Company, Inc.(1956) [2] H.M. Rietveld, A profile refinement method for nuclear and magnetic structures, J. Appl. Cryst., 2, 65(1969) [3] A.C. Larson and R.B. Von Dreele, "General Structure Analysis System(GSAS)", Los Alamos National Laboratory Report LAUR 86-748(2000) [4] L.B. McCusker et al, Rietveld refinement guidelines, J. Appl. Cryst., 32, 36(1999) [5] 梁敬魁编著,《粉末衍射法测定晶体结构》(下册),北京:科学出版社(2003) [img]https://www.instrument.com.cn/bbs/images/affix.gif[/img][url=http://www.instrument.com.cn/bbs/download.asp?ID=80161]A profile refinement method for nuclear and magnetic structures---JApplCryst.pdf[/url] [img]https://www.instrument.com.cn/bbs/images/affix.gif[/img][url=http://www.instrument.com.cn/bbs/download.asp?ID=80162]Rietveld refinement guidelines---JApplCryst.pdf[/url]
我在故我思
第1楼2008/02/29
楼主,你好!找了一篇,您看看吧。
X射线衍射物相分析在胶凝材料研究中的应用
zjchen3189
第3楼2008/02/29
X射线定量物相分析程序 你参考参考!
X射线定量物相分析程序
大陆
第4楼2008/02/29
贴几篇基本的论文.
更多资源请浏览http://prism.mit.edu/xray/resources.htm
[1] B.D. Cullity, Elements of X-ray Diffraction, Addison-Wesley publishing Company, Inc.(1956)
[2] H.M. Rietveld, A profile refinement method for nuclear and magnetic structures, J. Appl. Cryst., 2, 65(1969)
[3] A.C. Larson and R.B. Von Dreele, "General Structure Analysis System(GSAS)", Los Alamos National Laboratory Report LAUR 86-748(2000)
[4] L.B. McCusker et al, Rietveld refinement guidelines, J. Appl. Cryst., 32, 36(1999)
[5] 梁敬魁编著,《粉末衍射法测定晶体结构》(下册),北京:科学出版社(2003)
A profile refinement method for nuclear and magnetic structures---JApplCryst.pdf
Rietveld refinement guidelines---JApplCryst.pdf
醉卧古隆中
第6楼2008/03/01
Harold R. Powell
Molecular structure from X-ray diffraction
Annu. Rep. Prog. Chem., Sect. C: Phys. Chem., 2003, 99, 49 - 86
AnnuRepProgChemC99-49
醉卧古隆中
第7楼2008/03/01
H. R. Powell
Molecular structure from X-ray diffraction
Annu. Rep. Prog. Chem., Sect. C: Phys. Chem., 2000, 96, 139 - 175
AnnuRepProgChemC96-139
醉卧古隆中
第8楼2008/03/01
Mark A. Spackman
Charge densities from X-ray diffraction data
Annu. Rep. Prog. Chem., Sect. C: Phys. Chem., 1998, 94, 177 - 207
AnnuRepProgChemC94-177
醉卧古隆中
第9楼2008/03/01
David Rafaja
X-Ray Diffraction and X-Ray Reflectivity Applied to Investigation of Thin Films
Advances in Solid State Physics, 41 (2001) 275-286
AdvSolidStatePhys41-275
醉卧古隆中
第10楼2008/03/01
Giovanni Perego
Characterization of heterogeneous catalysts by X-ray diffraction techniques
Catalysis Today, Volume 41, Issues 1-3, Pages 251-259 (28 May 1998)
CatalToday41-251