先谢谢了。 1、 【作者】:Rachel A Oliver 【题名】:Advances in AFM for the electrical characterization of semiconductors 【期刊、年、卷、期、起止页码】:2008 Rep. Prog. Phys.71 076501 【全文链接】: http://dx.doi.org/10.1088/0034-4885/71/7/076501
2、 【作者】: Alba Avila 【题名】:Electrical Measurement Techniques in Atomic Force Microscopy 【期刊、年、卷、期、起止页码】:Critical Reviews in Solid State and Materials Sciences, 1547-6561, Volume 35, Issue 1, 2010, Pages 38 – 51 【全文链接】: http://www.informaworld.com/smpp/content~db=all~content=a919107392~frm=titlelink
3、 【作者】:Buh GH, 【题名】:PSPICE analysis of a scanning capacitance microscope sensor 【期刊、年、卷、期、起止页码】:JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 卷: 22 期: 1 页: 417-421 出版年: JAN-FEB 2004 【全文链接】: http://dx.doi.org/10.1116/1.1631290