1 【题名】(必填)：Effect of grid spacing on the inductance of ground grids 【作者】(必填)：Smith, T.S.; Paul, C.R.; 【年份，卷（期），起止页码】(必填)：Electromagnetic Compatibility, 1991. Symposium Record., IEEE 1991 nternational Symposium on Issue Date: 12-16 Aug 1991 On page(s): 72 - 77 【全文链接】(必填)：http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=148187
2 【题名】(必填)：The correlation between common mode currents and radiated emissions 【作者】(必填)：Kaires, R.G. 【年份，卷（期），起止页码】(必填)：Electromagnetic Compatibility, 2000. IEEE International Symposium on Issue Date : 2000 Volume : 1 On page(s): 141 - 146 vol.1 【全文链接】(必填)：http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=875552
3 【题名】(必填)：Analysis of CM Volt-Second Influence on CM Inductor Saturation and Design for Input EMI Filters in Three-Phase DC-Fed Motor Drive Systems 【作者】(必填)：Fang Luo; Shuo Wang; Fei Wang; Boroyevich, D.; Gazel, N.; Yong Kang; Baisden, A.C.; 【年份，卷（期），起止页码】(必填)：Power Electronics, IEEE Transactions on Issue Date: July 2010 Volume: 25 Issue:7 On page(s): 1905 - 1914 【全文链接】(必填)： http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=5420004
4 【题名】(必填)：Flyback Power Supply EMI Signature and Suppression Techniques 【作者】(必填)：Patel, H.K.; 【年份，卷（期），起止页码】(必填)： Power System Technology and IEEE Power India Conference, 2008. POWERCON 2008. Joint International Conference on Issue Date : 12-15 Oct. 2008 On page(s): 1 - 6 【全文链接】(必填)：http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=4745217
5 【题名】(必填)：Suppression of Gate Oscillation of Power MOSFET with Bridge Topology 【作者】(必填)：Fengjiang Wu; Hanying Gao; Li Sun; Ke Zhao; 【年份，卷（期），起止页码】(必填)： Intelligent Control and Automation, 2006. WCICA 2006. The Sixth World Congress on Issue Date: 0-0 0 On page(s): 8196 - 8200 【全文链接】(必填)：http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=1713572
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