非金属矿产null检测 | Characterising Complex Rock Samples using Symmetry-牛津仪器科技（上海）有限公司

方案摘要

方案下载

应用领域	地矿
检测样本	非金属矿产
检测项目
参考标准	无

Introduction Geological samples can be extremely challenging to analyse using EBSD, not only are they non-conductive, but many rocks contain a large number of phases, typically with low symmetry and often producing relatively weak diffraction patterns. The challenge is twofold: firstly the EBSD detector needs to be sensitive enough to acquire good, high resolution EBSPs in a short time period, and secondly the software needs to be able to distinguish reliably between all the minerals present in the sample. In this application we demonstrate the power of the Symmetry® CMOS-based detector coupled with the AZtec® software for the successful analysis of a multiphase, deformed eclogite sample. The extreme sensitivity of Symmetry enables high quality diffraction patterns to be collected in just a few milliseconds, and the advanced indexing algorithms within AZtec, as well as the full integration of EDS data, ensure reliable and accurate measurement of all phases.

方案下载

配置单

EBSD探测器Symmetry S3 牛津仪器
型号：Symmetry

¥100万 - 150万
咨询

方案详情

Introduction

Geological samples can be extremely challenging to analyse using EBSD, not only are they non-conductive, but many

rocks contain a large number of phases, typically with low symmetry and often producing relatively weak diffraction

patterns. The challenge is twofold: firstly the EBSD detector needs to be sensitive enough to acquire good, high

resolution EBSPs in a short time period, and secondly the software needs to be able to distinguish reliably between all the

minerals present in the sample.

In this application we demonstrate the power of the Symmetry® CMOS-based detector coupled with the AZtec® software

for the successful analysis of a multiphase, deformed eclogite sample. The extreme sensitivity of Symmetry enables high

quality diffraction patterns to be collected in just a few milliseconds, and the advanced indexing algorithms within AZtec,

as well as the full integration of EDS data, ensure reliable and accurate measurement of all phases.

上一篇一文了解 EDS 能谱技术发展历程

下一篇 AN1017_Preparaing lamellae with Backside Thinning with the OmniProbe 400...

文献贡献者

牛津仪器科技（上海）有限公司

白金会员丨第23年

查看全部资料