使用分子间相互作用分析仪MP-SPR在空气中以原子级分辨率表征石墨烯层

2016-09-13 11:44  下载量:7

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使用分子间相互作用分析仪MP-SPR在空气中以原子级分辨率表征石墨烯层: Chemical-vapour-deposition (CVD)-grown graphene films were characterized with non-invasive Multi-Parametric Surface Plasmon Resonance (MP-SPR). Both layer thickness and refractive index were obtained simultaneously from a single measurement without prior information on either of the parameters. After the first initial deposited layer, the layer thickness of the graphene monolayer was 0.37nm which is in good agreement with values from other methods. Refractive index and extinction coefficient of graphene layer on Al2O3 were 3.135 and 0.897 respectively at 670nm wavelength.

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