方案摘要
方案下载应用领域 | 电子/电气 |
检测样本 | 其他 |
检测项目 | |
参考标准 | 0 |
Spectroscopic ellipsometry is an excellent technique for the highly accurate characterization of TFT-LCD display panels based on a-Si and LTPS technologies. Owing to the sensitivity of the UVISEL spectroscopic ellipsometer and the advanced modeling features included in the DeltaPsi2 software it is possible to detect in a multistack different a-Si layers processed by various methods. Moreover the spectroscopic ellipsometry measurements allow determination of the grain size of p-Si films and illustrate the ability to characterize the crystallinity of silicon with high accuracy.
Spectroscopic ellipsometry is an excellent technique for the highly accurate characterization of TFT-LCD display panels based on a-Si and LTPS technologies. Owing to the sensitivity of the UVISEL spectroscopic ellipsometer and the advanced modeling features included in the DeltaPsi2 software it is possible to detect in a multistack different a-Si layers processed by various methods. Moreover the spectroscopic ellipsometry measurements allow determination of the grain size of p-Si films and illustrate the ability to characterize the crystallinity of
silicon with high accuracy.
荧光光谱+蛋白质检测+荧光特性
荧光光谱+智能形致变色荧光材料+荧光特性
荧光光谱+荧光探针+精准医疗
相关产品
HORIBA XploRA Nano原子力-拉曼联用系统
HORIBA高灵敏一体式FluoroMax-4荧光光谱仪
HORIBA Fluorolog®-3科研级荧光光谱仪
HORIBA XploRA INV多功能拉曼及成像光谱仪
HORIBA EMGA-Expert 氧氮氢分析仪
HORIBA EMGA-Pro氧氮氢分析仪
HORIBA 离心式粒度分析仪Partica CENTRIFUGE CN-300
HORIBA Fluorolog-QM模块化科研级稳瞬态荧光光谱仪
ViewSizer 3000 纳米颗粒追踪分析仪
HORIBA LabRAM Odyssey 高速高分辨显微共焦拉曼光谱仪
HORIBA LabRAM Soleil™高分辨超灵敏智能拉曼成像仪
HORIBA NANO Raman
HORIBA XGT-9000 X射线显微分析仪
HORIBA Duetta荧光及吸收光谱仪
HORIBA MacroRAM 台式一体化拉曼光谱仪
关注
拨打电话
留言咨询