方案摘要
借助原子力显微镜与TF Analyzer 2000铁电分析仪联用对微区的铁电压电性能表征Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope
文献贡献者
原子力显微镜结合铁电分析仪研究Nd掺杂Bi4Ti3O12 薄膜的机电性质
Mechanical properties and quality of diamond films by MPECVD
Low-temperature plasma enhanced chemical vapour deposition(PECVD) of carbon nanotubes(CNT)
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