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仪器简介：
主要特点：
The 643 Single Tilt Analytical Holder incorporates design features optimized for electron diffraction and EDX analysis of crystalline TEM specimens.
主要特点：
Key Features
Low background design
Beryllium specimen cradle, Hexring® and Anti-twist washer to gently and securely hold the specimen in place
Reduced Shadowing
Optimized for EDX analysis
Integral Faraday Cup
Quantitative measurement of the incident electron current
Tilt ranges and compatibility of specimen holders vary according to the TEM manufacturer, model, pole piece gap, and the presence of in-gap accessories. Please contact your local Gatan representative for more information.
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