LaVision ParticleMaster-IMI 干涉米氏粒径测量
LaVision ParticleMaster-IMI 干涉米氏粒径测量
LaVision ParticleMaster-IMI 干涉米氏粒径测量
LaVision ParticleMaster-IMI 干涉米氏粒径测量

LaVision ParticleMaster-IMI 干涉米氏粒径测量

参考价:¥80万 - 100万
型号: ParticleMaster-IMI
产地: 德国
品牌: LaVision GmbH
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Interferometric Mie Imaging

LaVision’s ParticleMaster IMI imaging system is optimized for spray investigations of smaller droplets at low and medium droplet densities. Defocused Mie scattering is used to generate a fringe pattern from each droplet with its fringe spacing related to the droplet size. This intererometric sizing method is limited to transparent and spherical droplets. The ParticleMaster IMI system is hardware compatible with LaVision’s FlowMaster 2D or Stereo PIV systems.

ParticleMaster IMI
System Features
  • autodetection with droplet location from a single camera

  • droplet size from fringe pattern analysis

  • droplet velocity derived from double frame exposures

  • velocity - size correlations, histograms, scatterplots

 
Principle of IMI droplet sizing
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Shadowgraphy vs. Interferometric Mie Imaging

Both, ParticleMaster Shadow and IMI are based on imaging techniques to measure particle size. Their limit to smaller size is determined by the nature of light. While the shadowgraphy technique uses a direct image, IMI is based on coherent light scattering and allows to extend the range of detectable droplets to even smaller sizes.

ParticleMaster
Application Matrix

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Product Information


 ParticleMaster


LaVision ParticleMaster-IMI 干涉米氏粒径测量信息由北京欧兰科技发展有限公司为您提供,如您想了解更多关于LaVision ParticleMaster-IMI 干涉米氏粒径测量报价、型号、参数等信息, 欢迎来电或留言咨询。除供应LaVision ParticleMaster-IMI 干涉米氏粒径测量外,北京欧兰科技发展有限公司还可为您提供LaVision ParticleMaster-Shadow 粒径测量系统、激光诱导白炽光烟雾粒子成像分析仪(LII)等产品, 公司有专业的客户服务团队,是您值得信赖的合作伙伴。
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