| 供货周期： | 一周 |
| 品牌： | |
| 规格： | 25 to 75nm |
| 货号： | 620 |
| CAS号： |
medium resolution test for Scanning Electron Microscopy
The various spacings created by the dendritic structure give the gap test. The topographical arrangement of dendrites leads to the gray level test. The specimen is non-magnetic, vacuum clean, has no adverse reaction to the electron probe and requires no surface coating. It is most useful for working in the probe size range of 25 to 75nm.
This standard is supplied unmounted with instructions and with a SEM micrograph
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