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第2楼2010/04/19
http://bbs.instrument.com.cn/shtml/20100419/2507464/
序号】: 1
【作者】:KUTNEY MICHAEL C.(Applied Materials, Inc., Ca, Usa) MA SHAWMING
(Applied Materials, Inc., Ca, Usa) ZHAO ALLEN(Applied Materials, Inc., Ca,
Usa) DELGADINO GERARDO A.(Applied Materials, Inc., Ca, Usa) HOFFMAN DANIEL
J.(Applied Materials, Inc., Ca, Usa) HORIOKA KEIJA(Applied Materials, Inc.,
Ca, Usa) SINHA ASHOK(Applied Materials, Inc., Ca, Usa)
【题名】:Minimizing Plasma-Induced Charging Damage during Multi-Step Etching
of Dual-Damascene Trench and Via Structures
【期刊】:;Proc Int Symp Dry Process
【年、卷、期、起止页码】:VOL.5th;NO.;PAGE.339-340(2005)
【全文链接】:http://sciencelinks.jp/j-
east/article/200623/000020062306A0828446.php
http://direct.bl.uk/bld/PlaceOrder.do?UIN=184988104&ETOC=RN&from=searchengine
序号】: 2
【作者】:KUTNEY MICHAEL C.(Applied Materials, Inc., Ca, Usa) MA SHAWMING
(Applied Materials, Inc., Ca, Usa) HOFFMAN DANIEL J.(Applied Materials,
Inc., Ca, Usa) HORIOKA KEIJI(Applied Materials, Inc., Jpn)
【题名】:Reducing Plasma Non-Uniformity and Plasma-Induced Charging Damage by
Optimizing Etch Chamber Design
【期刊】:;Proc Int Symp Dry Process
【年、卷、期、起止页码】:VOL.6th;NO.;PAGE.211-212(2006)
【全文链接】:http://sciencelinks.jp/j-
east/article/200703/000020070307A0026115.php
http://direct.bl.uk/bld/OrderDetails.do?did=1&uin=202591539