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  • 序号】: 1
    【作者】:KUTNEY MICHAEL C.(Applied Materials, Inc., Ca, Usa) MA SHAWMING(Applied Materials, Inc., Ca, Usa) ZHAO ALLEN(Applied Materials, Inc., Ca, Usa) DELGADINO GERARDO A.(Applied Materials, Inc., Ca, Usa) HOFFMAN DANIEL J.(Applied Materials, Inc., Ca, Usa) HORIOKA KEIJA(Applied Materials, Inc., Ca, Usa) SINHA ASHOK(Applied Materials, Inc., Ca, Usa)
    【题名】:Minimizing Plasma-Induced Charging Damage during Multi-Step Etching of Dual-Damascene Trench and Via Structures
    【期刊】:;Proc Int Symp Dry Process
    【年、卷、期、起止页码】:VOL.5th;NO.;PAGE.339-340(2005)
    【全文链接】:http://sciencelinks.jp/j-east/article/200623/000020062306A0828446.php

    序号】: 2
    【作者】:KUTNEY MICHAEL C.(Applied Materials, Inc., Ca, Usa) MA SHAWMING(Applied Materials, Inc., Ca, Usa) HOFFMAN DANIEL J.(Applied Materials, Inc., Ca, Usa) HORIOKA KEIJI(Applied Materials, Inc., Jpn)
    【题名】:Reducing Plasma Non-Uniformity and Plasma-Induced Charging Damage by Optimizing Etch Chamber Design
    【期刊】:;Proc Int Symp Dry Process
    【年、卷、期、起止页码】:VOL.6th;NO.;PAGE.211-212(2006)
    【全文链接】:http://sciencelinks.jp/j-east/article/200703/000020070307A0026115.php

    谢谢!
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  • 灰米奇

    第1楼2010/04/19

    sciencelinks没有提供全文的就不好找了。

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  • fdlxw

    第2楼2010/04/19

    http://bbs.instrument.com.cn/shtml/20100419/2507464/
    序号】: 1
    【作者】:KUTNEY MICHAEL C.(Applied Materials, Inc., Ca, Usa) MA SHAWMING

    (Applied Materials, Inc., Ca, Usa) ZHAO ALLEN(Applied Materials, Inc., Ca,

    Usa) DELGADINO GERARDO A.(Applied Materials, Inc., Ca, Usa) HOFFMAN DANIEL

    J.(Applied Materials, Inc., Ca, Usa) HORIOKA KEIJA(Applied Materials, Inc.,

    Ca, Usa) SINHA ASHOK(Applied Materials, Inc., Ca, Usa)
    【题名】:Minimizing Plasma-Induced Charging Damage during Multi-Step Etching

    of Dual-Damascene Trench and Via Structures
    【期刊】:;Proc Int Symp Dry Process
    【年、卷、期、起止页码】:VOL.5th;NO.;PAGE.339-340(2005)
    【全文链接】:http://sciencelinks.jp/j-

    east/article/200623/000020062306A0828446.php

    http://direct.bl.uk/bld/PlaceOrder.do?UIN=184988104&ETOC=RN&from=searchengine


    序号】: 2
    【作者】:KUTNEY MICHAEL C.(Applied Materials, Inc., Ca, Usa) MA SHAWMING

    (Applied Materials, Inc., Ca, Usa) HOFFMAN DANIEL J.(Applied Materials,

    Inc., Ca, Usa) HORIOKA KEIJI(Applied Materials, Inc., Jpn)
    【题名】:Reducing Plasma Non-Uniformity and Plasma-Induced Charging Damage by

    Optimizing Etch Chamber Design
    【期刊】:;Proc Int Symp Dry Process
    【年、卷、期、起止页码】:VOL.6th;NO.;PAGE.211-212(2006)
    【全文链接】:http://sciencelinks.jp/j-

    east/article/200703/000020070307A0026115.php

    http://direct.bl.uk/bld/OrderDetails.do?did=1&uin=202591539

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  • fdlxw

    第3楼2010/04/19

    更新了 british library direct,看看有没有tx有access的?谢谢

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  • yilai1002

    第4楼2010/04/19

    关键是找不到可下载链接

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  • shawming

    第5楼2010/05/18

    I have those two papers, please let me know your e-mail address.My e-mail address is shawmingma@gmail.com
    /Shawming Ma

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  • shawming

    第6楼2010/05/18

    Oh, I figure out how to upload the papers into the forum so here you go for both papers!

0
  • 该帖子已被版主-dong3626加4积分,加2经验;加分理由:help
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