【序号】:1 【作者】:Miccio, L.; Alfieri, D.; Grilli, S.; Ferraro, P.; Finizio, A.; De Petrocellis, L.; Nicola, S. D.; 【题名】:Direct full compensation of the aberrations in quantitative phase microscopy of thin objects by a single digital hologram【期刊】:ieee 【年、卷、期、起止页码】: 10.1063/1.2432287 【全文链接】:http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=4827755
【序号】:2 【作者】:Bahram Javidi, Pietro Ferraro, Seung-Hyun Hong, Sergio De Nicola, Andrea Finizio, Domenico Alfieri, and Giovanni Pierattini 【题名】:"Three-dimensional image fusion by use of multiwavelength digital holography 【期刊】:Opt. Lett. 【年、卷、期、起止页码】:30, 144-146 (2005) 【全文链接】:http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-30-2-144
【序号】:3 【作者】:Giuseppe Coppola, Pietro Ferraro, Mario Iodice, and Sergio De Nicola 【题名】:Method for Measuring the Refractive Index and the Thickness of Transparent Plates with a Lateral-Shear, Wavelength-Scanning Interferometer 【期刊】: Appl. Opt 【年、卷、期、起止页码】:42, 3882-3887 (2003) 【全文链接】:http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-19-3882
【序号】:4 【作者】:S. De Nicola, A. Finizio, G. Pierattini, D. Alfieri, S. Grilli, L. Sansone, and P. Ferraro 【题名】:Recovering correct phase information in multiwavelength digital holographic microscopy by compensation for chromatic aberrations 【期刊】:Opt. Lett 【年、卷、期、起止页码】:30, 2706-2708 (2005) 【全文链接】:http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-30-20-2706
【序号】:5 【作者】:Sergio De Nicola, Pietro Ferraro, Andrea Finizio, and Giovanni Pierattini 【题名】:Reflective Grating Interferometer: a Folded Reversal Wave-Front Interferometer 【期刊】:Appl. Opt 【年、卷、期、起止页码】:38, 4845-4849 (1999) 【全文链接】:http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-22-4845