Full name of Instrument | Standards |
XRD(X-ray diffractometer X射线衍射) | NIOSH 9000:1994、ISO_DIS_22262-2、JIS A 1481:2006、EPA/600/R-93/116、GB/T 23263-2009、GB/T 15344-1994 |
PLM (Polorized light microscope偏光显微镜) | NIOSH 9002、ISO 22262-1、EPA/600/R-93/116、JIS A1481:2006 |
TEM/SEM(Transmission/Scanning electron microscope透射/扫描电镜) | EPA/600/R-93/116、ISO/DIS 22262-1 |
PCM (Phase contrast Microscope相差显微镜) | JIS A 1481-2008、GBZ/T 192.5-2007 |