【序号】: 1 【作者】: K. Kajiwara 【题名】: Crystalline effects on depth resolution in AES depth profiling 【期刊】: Surface and Interface Analysis, Volume 22, Issues 1-12, Pages 22-26 (July 1994) 【全文链接】:http://onlinelibrary.wiley.com/doi/10.1002/sia.740220108/pdf
【序号】: 2 【作者】: 【题名】: American society for testing and materials. Standard practice for determination of the specimen area contributing to the detected in X-ray photoelectron spectroscopy and Auger electron spectroscopy (E1217-87) 【期刊】: Surface and Interface Analysis, Volume 17, Issue 6, Pages 391-396 (June 1991) 【全文链接】:http://onlinelibrary.wiley.com/doi/10.1002/sia.740170615/pdf
【序号】: 3 【作者】: P. De Volder, R. Hoogewijs, R. De Gryse, L. Fiermans, J. Vennik 【题名】: Maximum likelihood common factor analysis in Auger electron spectroscopy 【期刊】: Surface and Interface Analysis, Volume 17, Issue 6, Pages 363-372 (June 1991) 【全文链接】:http://onlinelibrary.wiley.com/doi/10.1002/sia.740170612/pdf
【序号】: 4 【作者】: H. L. L. Watton, A. G. Fitzgerald, P. A. Moir 【题名】: Composition of thin surface layers obtained by X-ray photoelectron spectroscopy 【期刊】: Surface and Interface Analysis, Volume 17, Issue 6, Pages 320-324 (June 1991) 【全文链接】:http://onlinelibrary.wiley.com/doi/10.1002/sia.740170605/pdf
【序号】: 5 【作者】: S. Mischler, H. E. Bishop 【题名】: A novel practical approach to the quantification of Auger electron spectroscopy 【期刊】: Surface and Interface Analysis, Volume 17, Issue 6, Pages 315-319 (June 1991) 【全文链接】:http://onlinelibrary.wiley.com/doi/10.1002/sia.740170604/pdf