【序号】:1 【作者】:M. Zier 【题名】:Interface formation and reactions at Ta-Si and Ta-SiO 2 interfaces studied by XPS and ARXPS 【期刊】:Journal of Electron Spectroscopy and Related Phenomena 【年、卷、期、起止页码】: 2004, 137-140, 229-233 【全文链接】:https://www.infona.pl/resource/bwmeta1.element.elsevier-c410ed44-858f-3e9c-9bc4-99b7df991329 谢谢!