null检测 | ?PP-TOFMS Depth Profiling of ZnO Thin layers co-doped with Rare Earths for Photonic Materials-HORIBA（中国）

方案摘要

方案下载

应用领域	电子/电气
检测样本
检测项目
参考标准	0

This example shows that PP-TOFMS is a fast and reliable technique for depth profiling of rare earth doped ZnO thin films. Tb and Eu prof les are obtained with high sensitivity and high depth resolution. This type of information is typically provided by SIMS, RBS or depth profiling XPS but not as rapidly and readily and at a higher cost. Such profiles turn out to be powerful complementary information to understand photoluminescence data.

方案下载

方案详情

This example shows that PP-TOFMS is a fast and reliable technique for depth profiling of rare earth doped ZnO thin films. Tb and Eu prof les are obtained with high sensitivity and high depth resolution. This type of information is typically provided by SIMS, RBS or depth profiling XPS but not as rapidly and readily and at a higher cost. Such profiles turn out to be powerful complementary information to understand photoluminescence data.

上一篇颗粒分析+混合氧化石墨烯+分散状态的混合比例

下一篇使用UVISEL相位调制型椭圆偏振光谱仪表征DNA传感器垫片

文献贡献者

HORIBA（中国）

白金会员丨第22年

查看全部资料