方案摘要
方案下载应用领域 | 半导体 |
检测样本 | 光电器件 |
检测项目 | |
参考标准 | 0 |
Spectroscopic ellipsometry is a powerful technique to characterize the thickness and optical constants of encapsulated OLED devices. For the case of non-transparent encapsulation thecombination of ellipsometric measurements via the glass substrate and the powerful modelling features of DeltaPsi2 software make it possible to analyze “this reverse sample”. Ellipsometric investigation of a 1-month aging process for an α-NPD film show a significant decrease of the refractive index, suggesting a decrease in the material density.
Spectroscopic ellipsometry is a powerful technique to characterize the thickness and optical constants of encapsulated OLED devices.
For the case of non-transparent encapsulation thecombination of ellipsometric measurements via the glass substrate and the powerful modelling features of DeltaPsi2 software make it possible to analyze “this reverse sample”.
Ellipsometric investigation of a 1-month aging process for an α-NPD film show a significant decrease of the refractive index, suggesting a decrease in the material density.
颗粒分析+混合氧化石墨烯+分散状态的混合比例
颗粒分析+聚苯乙烯乳胶混合样品+粒径分布
颗粒分析+二氧化硅+CMP浆料质量控制
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