表征OLED封装器件的厚度和光学常数-研究OLED的老化过程

2016/09/21   下载量： 8 次

方案摘要

方案下载
应用领域 半导体
检测样本 光电器件
检测项目
参考标准 0

Spectroscopic ellipsometry is a powerful technique to characterize the thickness and optical constants of encapsulated OLED devices. For the case of non-transparent encapsulation thecombination of ellipsometric measurements via the glass substrate and the powerful modelling features of DeltaPsi2 software make it possible to analyze “this reverse sample”. Ellipsometric investigation of a 1-month aging process for an α-NPD film show a significant decrease of the refractive index, suggesting a decrease in the material density.

方案下载
配置单
方案详情

Spectroscopic ellipsometry is a powerful technique to characterize the thickness and optical constants of encapsulated OLED devices.

For the case of non-transparent encapsulation thecombination of ellipsometric measurements via the glass substrate and the powerful modelling features of DeltaPsi2 software make it possible to analyze “this reverse sample”.

Ellipsometric investigation of a 1-month aging process for an α-NPD film show a significant decrease of the refractive index, suggesting a decrease in the material density.


上一篇 颗粒分析+混合氧化石墨烯+分散状态的混合比例
下一篇 PDP等离子体显示屏

文献贡献者

HORIBA（中国）
白金会员 丨 第22年
查看全部资料
相关仪器 更多
相关方案
更多
当前位置： HORIBA 方案 表征OLED封装器件的厚度和光学常数-研究OLED的老化过程

关注

拨打电话

留言咨询