null检测 | 原子力显微镜探针弹性系数的热调制测定法-布鲁克纳米表面仪器部(Bruker Nano Surfaces)

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The atomic force microscope (AFM) is a sensitive force measurement instrument. But sensitivity and measurement accuracy are two different issues. This application note describes a solution for improving the accuracy of AFM force measurements through more precise calibration of the AFM cantilever spring constant. There are several well-documented methods for calibrating the spring constant, but the one described here offers not only improved precision, but also ease of use and speed, because the procedure is straightforward, and relies only on the AFM’s own hardware and software.

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