方案摘要
方案下载应用领域 | |
检测样本 | |
检测项目 | |
参考标准 |
Dektak® stylus profilers provide accurate, high resolution measurement of surface shape and texture. The heart of a Dektak system is its measurement stylus, which runs over the surface as the sample is moved beneath it on the stage. A variety of stylus shapes and sizes are available to optimize measurement for particular applications. This paper describes the variety of styli that are currently available from Veeco, and guidelines for choosing the optimal tips for your application.
台阶仪在三维形貌表征领域的应用
3D surface Profi ling applications
双焦面实时超高分辨系统Bruker3DVutura
多功能双光子成像平台Bruker2pplus
高品质双光子成像系统BrukerInvestigator
场扫描共聚焦成像系统BrukerOpterra II
布鲁克透射电镜专用原位纳米力学系统PI 95
布鲁克电镜专用原位纳米力学测试系统PI 88
布鲁克电镜专用原位纳米力学系统 PI 85L
布鲁克高精度纳米力学测试系统TI Premier
布鲁克高精度纳米力学测试系统TI 980
布鲁克三维光学显微镜Contour Elite
摩擦磨损试验机UMT-TriboLab
布鲁克原子力显微镜Dimension FastScan
探针式表面轮廓仪DektakXT
光学轮廓仪NPFLEX 3D
扫描探针显微镜系统Dimension Edge
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