方案摘要
方案下载应用领域 | 钢铁/金属 |
检测样本 | 其他 |
检测项目 | 理化分析>形貌观察分析 |
参考标准 | 暂无 |
采用LaVision公司DaVis7.2版DIC分析软件包,对Zr50Cu40Al10块体金属玻璃材料的扫描电镜图片进行分析,获得了形变,应变和残余应力的信息。
This paper reports a new technique, namely the
incremental micro-hole-drilling method (IμHD) for mapping
in-plane residual or applied stresses incrementally
as a function of depth at the micron-scale laterally and
the sub-micron scale depth-wise. Analogous to its
macroscale counterpart, it is applicable either to crystalline
or amorphous materials, but at the sub-micron scale.
Our method involves micro-hole milling using the
focused ion beam (FIB) of a dual beam FEGSEM/FIB
microscope. The resulting surface displacements are
recorded by digital image correlation of SEM images
recorded during milling. The displacement fields
recorded around the hole are used to reconstruct the
stress profile as a function of depth. In this way residual
stresses have been characterized around a drilled hole of
1.8microns. diameter, enabling the profiling of the stress
variation at the sub-micron scale to a depth of 1.8 microns.
The new method is used to determine the near surface stresses
in a (peened) surface-severe-plastically-deformed (S2PD)
Zr50Cu40Al10 (in atomic percent, at.%) bulk metallic glass
bar. In plane principal stresses of -800 MPa ± 90 MPa and
−600 MPa ± 90 MPa were measured, the maximum
compressive stress being oriented 15° to the axis of the bar.
在一个双稳湍流涡旋火焰中,对间歇性动态的时间-频率定位
Particle-laden Taylor-Couette流:高阶转变和径向局部波浪涡旋的证据
7根杆束的流体-结构相互作用:用实验数据对比数值模拟
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