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Thorlabs' dual scanning slit Beam Profiler is easy to align and features fast simultaneous measurement of both the X and Y profiles with a large dynamic range of 72 dB. The beam diameter is measured in accordance with the ISO11146 standard. The diameter of the beam can be displayed using a number of industry standard clip levels such as 1/e2 (13.5%) and 50% or an arbitrary clip level input. Please see the User Interface tab above for more details on the functionality of the software.
The system is available in 4 wavelength ranges: UV 200-1100 nm, VIS 400-1100 nm, IR 700-1800 nm, and IR 1000-2700 nm. Additionally, two slit and aperture sizes are offered: BP104 models have a physical aperture diameter of 4 mm and can accommodate beam diameters as small as 10 µm (1/e2), while BP109 models have a physical aperture diameter of 9 mm and accommodate beam diameters as small as 20 µm (1/e2). The operating principles are detailed on the tab provided above and labeled "Operation."
A variable scan rate of up to 20 Hz allows for real time optical system alignment. Both beam parameters and spatial power distribution can be monitored in dynamically changing systems. To obtain absolute optical power measurements, the user can perform a calibration using the integrated power meter and software and applying a calibration measurement at the wavelength of interest.
The Beam Profiler can work directly with a connected PC with no additional hardware or power supply required. For ease of use, Thorlabs utilizes a Hi-Speed USB2.0 interface to connect the measurement head with user supplied PC. Flexible data export options and the readout option via TCP/IP to standart data socket servers ease the integration into customized data processing environments.
Pulsed Laser Beams
Pulsed laser sources with repetition rates of 10 Hz or higher and of any pulse widths can be measured. Several scans of the XY slit pairs are used to reconstruct the complete beam shape. Synchronization is done by manually adjusting the scanning speed to very close to an integer fraction of the laser’s repetition frequency. See Operations Manual for a detailed description.
Each Beamprofiler comes with the following parts:
BP100 Series Profiler Head
USB 2.0 Connection Cable, 2 m
Beam Profiler Software CD ROM with GUI software package and LabVIEW™ and LabWINDOWS™ /CVI Driver Set
Printed Operation Manual
技术参数：
Item # BP10x-UV BP10x-VIS BP10x-IR BP10x-IR2
Wavelength Range 200 - 1100 nm 400 - 1100 nm 700 - 1800 nm 1000 - 2700 nm
Detector Type Si - UV Enhanced Si Ge Extended InGaAs
Aperture Diameter 4 mm (BP104-xx), 9 mm (BP109-xx)
Slit Size 2.5 µm (BP104-xx), 5 µm (BP109-xx)
Min Beam Diameter 10 µm (BP104-xx), 20 µm (BP109-xx)
主要特点：
Features
High Precision Analysis of Beam Quality and Spatial Power Distribution
Single Stand-Alone Measurement Head
For Continuous and Pulsed Laser Beams
Variable Scanning Speed
Power Meter Integrated (not calibrated)
High Dynamic Range
Low Noise Amplifier
Gaussian Fit Function
2D or Pseudo 3D Diagrams
Average and Max-Hold Functions
Powerful GUI: Separate X and Y Profiles
Fast USB 2.0 Interface to PC, Live Data Readout Via TCP/IP to a DataSocket Server
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