【序号】:1 【作者】:Yimei Zhu, Joe Wall 【题名】:Aberration-Corrected Electron Microscopes at Brookhaven Microscopes at Brookhaven National Laboratory 【期刊】:Advances in Imaging and Electron Physics 【年、卷、期、起止页码】:Volume 153, 2008,Pages 481-523 【全文链接】:http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B7RNM-4WJGD0P-K-1&_cdi=25782&_user=128590&_pii=S1076567008010124&_origin=search&_coverDate=12%2F31%2F2008&_sk=998469999&view=c&wchp=dGLzVlz-zSkzS&md5=ea3fe385b83a5a024df1971fae660806&ie=/sdarticle.pdf