ACF absorption correction factor A/D analog to digital (converter) ADF annular dark field AEM analytical electron microscope/microscopy AES Auger electron spectrometer/spectroscopy AFF aberration-free focus ALCHEMI atom location by channeling-enhanced microanalysis APB anti-phase domain boundary ATW atmospheric thin window BF bright field BFP back focal plane BSE backscattered electron BSED backscattered-electron diffraction BZB Brillouin-zone boundary C(1,2,etc..)condenser (l, 2, etc.) lens CB coherent bremsstrahlung CBED convergent-beam electron diffraction CBIM convergent-beam imaging CCD charge-coupled device CCF cross-correlation function CCM charge-collection microscopy CDF centered dark field CF coherent Fennel/Foucault CFEG cold field-emission gun CL Cathodeoluminescence CRT cathode-ray tube CS crystallographic shear CSL coincident-site lattice DF dark field DOS density of states DP diffraction pattern DQE detection of quantum efficiency DSTEM dedicated scanning transmission electron microscopy DTSA desktop spectrum analyzer EBIC electron beam-induced current/conductivity EELS electron energy-loss spectrometry EFI energy-filtered imaging ELNES energy-loss near-edge structure ELP energy-loss program (Gatan) EMMA electron microscope microanalyzer EMS electron microscopy image simulation EPMA electron probe microanalyzer ESCA electron spectroscopy for chemical analysis ESI electron spectroscopic imaging EXAFS extended X-ray absorption fine structure EXELFS extended energy-loss fine structure FCF fluorescence correction factor FEG field-emission gun FET field-effect transistor FFT fast Fourier transform FOLZ first-order Laue zone FSE fast secondary electron FTP file transfer protocol FWHM full width at half maximum FWTM full width at tenth maximum GB grain boundary GCS generalized cross section GIF Gatan image filter GOS generalüed oscillator strength HAADF high-angle annular dark field HOLZ higher-order Laue zone HPGe high-purity germanium HRTEM high-resolution transmission electron microscope/microscopy HV high vacuum HVEM high voltage electron microscope/microscopy IDB inversion domain boundary IEEE International Electronics and Electrical Engineering IG intrinsic Ge IVEM intermediate voltage electron microscope/microscopy K-M Kossel-Möllenstedt LEED low-energy electron diffraction LLS linear least-squares LUT look-up table MC minimum contrast MCA multichannel analyzer MDM minimum detectable mass MLS multiple least-squares MMF minimum mass fraction MSDS material safety data sheets NCEMSS National Center for Electron Microscopy simulation system NIH National Institutes of Health NIST National Institute of Standards and Technology OR orientation relationship OTEDP oblique-textured electron diffraction pattern PB phase boundary P/B peak-to-background ratio PEELS parallel electron energy-loss spectrometer/spectroscopy PIMS Precision Ion-Milling System PIPS Precision Ion-Polishing System PM photomultiplier POA phase-object approximation QHRTEM quantitative high-resolution transmission electron microsc. RB translation boundary (yes, it does!) RCP rocking-beam channeling patterns RDF radial distribution function REM reflection electron microscope/microscopy RHEED reflection high-energy electron diffraction RHF relativistic Hartree-Fock RHFS relativistic Hartree-Fock-Slater SAD selected-area diffraction SE secondary electron SEELS serial electron energy-loss spectrometer/spectrometry SEM scanning electron microscope/microscopy SF stacking fault SHRLI simulated high-resolution lattice images SIMS secondary ion mass spectrometry S/N signal-to-noise ratio SOLZ second-order Laue zone SRM standard reference material STEM scanning transmission electron microscope/microscopy STM scanning tunneling microscope/microscopy TB twin boundary TEM transmission electron microscope/microscopy TMBA too many bloody acronyms UHV ultrahigh vacuum UTW ultra thin window V/F voltage to frequency (converter) VLM visible-light microscope/microscopy WB weak beam WBDF weak-beam dark field WDS wavelength-dispersive WP whole pattern WPOA weak-phase object approximation WWW World Wide Web XANES X-ray absorption near-edge structure XEDS X-ray energy-dispersive XRD X-ray diffraction YBCO yttrium-barium-copper oxide YAG yttrium-aluminum garnet ZAF atomic number, absorption, fluorescence correction ZAP zone-axis pattern ZOLZ zero-order Laue zone
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