国外标准
天圆地方
第1楼2012/06/08
找到一份ASTM F1329-00,请确认ASTM F1329-02是否入库了
灰米奇
第2楼2012/06/10
ASTM F1239-02Standard Test Methods for Oxygen Precipitation Characterization of Silicon Wafers by Measurement of Interstitial Oxygen Reduction (Withdrawn 2003)
第3楼2012/06/10
ASTM F1391-93(2000) Standard Test Method for Substitutional Atomic Carbon Content of Silicon by Infrared Absorption (Withdrawn 2003)
qblue0812
第4楼2012/06/11
是这两篇没错
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