We are pleased to announce the location and dates for our next "Accuracy in Powder Diffraction" meeting. This meeting, designated APD-IV, is the fourth in the series which are held approximately every ten years. They constitute a review of the state of the art in powder diffraction techniques, instrumentation and data analysis methods. The meeting will host a program of invited presentations plus a contributed poster session. APD-IV will cover the broad range of developments in powder diffraction metrology and methodology in the time since APD-III. In addition, we will host an exhibition area where leading instrument manufacturers and providers will be available to discuss recent commercial developments in the diffraction context.
The organizers invite contributed posters that also address issues of accuracy in powder diffraction measurements. The posters should be prepared in A0 format, portrait orientation. Download the abstract template(http://www.nist.gov/director/upload/APD-IV_Abstract_Template.docx). Abstracts should be sent to Jim Cline and Ian Madsen: james.cline@nist.gov and Ian.Madsen@csiro.au. Abstracts are due by April 1st, 2013.
Travel:
Download an invitation letter (http://www.nist.gov/director/upload/APD-IV_Invitation.pdf) for the purposes of obtaining travel documents.
If you are not registered, you will not be allowed on site.
Registered attendees will receive security and campus instructions prior to the workshop.
NON U.S. CITIZENS PLEASE NOTE: All foreign national visitors who do not have permanent resident status and who wish to register for the above meeting must supply additional information. Failure to provide this information prior to arrival will result, at a minimum, in significant delays (up to 24 hours) in entering the facility. Authority to gather this information is derived from United States Department of Commerce Department Administrative Order (DAO) number 207-12. You can download the required form NIST-1260 (http://www.nist.gov/mml/upload/n1260-Visitor.pdf). Fill out the form and email to James Cline [james.cline@nist.gov].
Invited Speakers:
Robert von Dreele Argonne National Laboratory, USA
Jim Cline National Institute of Standards and Technology, USA
Marcus Mendenhall Vanderbilt University, USA
Soorya Kabekkodu International Centre for Diffraction Data, USA
Mark D. Raven CSIRO, Australia
Nicola Scarlett CSIRO, Australia
Robert Dinnebier Max Planck Institute, Germany
Andy Fitch European Synchrotron Radiation Facility, France
Dimitri N. Argyriou European Spallation Source
Pamela Whitfield National Research Council Canada, Canada
Yasukazu Nakye Rigaku, Japan
Detlev Gotz PANalytical B.V., The Netherlands
Roger Durst Bruker AXS, USA
Ali Khounsary Argonne National Laboratory, USA
Mike Hoyland IUCr Chester, UK
Jacco van de Streek University of Copenhagen, Denmark
Radovan Cerny University of Geneva, Switzerland
Takashi Ida Nagoya Institute of Technology, Japan
Peter Chupas Argonne National Laboratory, USA
John Evans Durham University, UK
Kristian Ufer Federal Institute for Geosciences and Natural Resources, Germany
Jonathon Wright European Synchrotron Radiation Facility, France
Maryjane Tremayne University of Birmingham, UK
Johan de Villiers University of Pretoria, South Africa
Doug Allen Freeport-McMoRan Copper & Gold, USA
Uwe König PANalytical B.V., The Netherlands
Simon Billinge Columbia University, USA
Daniel T. Bowron ISIS, Rutherford Appleton Laboratory, UK
Katharine Page Los Alamos National Laboratory, USA
Matteo Leoni University of Trento, Italy
Andreas Leineweber Max Planck Institute, Germany
Mark Daymond Queen’s University, Canada
Henning Friis Poulsen Technical University of Denmark, Denmark
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