【序号】：1 【作者】：Roediger, P.; Wanzenboeck, H. D.; Hochleitner, G.; et al. 【题名】：Evaluation of chamber contamination in a scanning electron microscope 【期刊、年、卷、期、起止页码】：JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B Volume: 27 Issue: 6 Pages: 2711-2717
【序号】：2 【作者】：Leontowich, Adam F. G.; Hitchcock, Adam P 【题名】：Secondary electron deposition mechanism of carbon contamination 【期刊、年、卷、期、起止页码】：JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B Volume: 30 Issue: 3 Article Number: 030601 【全文链接】：http://scitation.aip.org/content/avs/journal/jvstb/30/3/10.1116/1.3698602
【序号】：3 【作者】：Peter Rez, Laurence A.J. Garvie and Andrew V. Chizmeshya 【题名】：The Giant Core Hole Effect in Electron Energy Loss Spectroscopy 【期刊、年、卷、期、起止页码】：Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003, pp 828 - 829
【序号】：4 【作者】：F. Zemlin,K. Weiss,P. Schiske,W. Kunath,K.-H. Herrmann 【题名】：Coma-free alignment of high resolution electron microscopes with the aid of optical diffractograms 【期刊、年、卷、期、起止页码】：Ultramicroscopy, Volume 3, 1978, Pages 49–60 【全文链接】：http://www.sciencedirect.com/science/article/pii/S0304399178800060
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