碳材料null检测 | 表征非晶碳薄膜的厚度和光学常数-HORIBA（中国）

方案摘要

方案下载

应用领域	材料
检测样本	碳材料
检测项目
参考标准	0

The UVISEL Spectroscopic Ellipsometer is the ideal tool for reliable film thickness and optical constants characterization of amorphous carbon coatings, even in difficult cases where the film thickness is very thin. Roughness, and interface “adhesion” can also been determined. ?

方案下载

配置单

HORIBA UVISEL Plus研究级经典型椭偏仪
型号：UVISEL

面议
咨询

方案详情

The UVISEL Spectroscopic Ellipsometer is the ideal tool for reliable film thickness and optical constants characterization of amorphous carbon coatings, even in difficult cases where the film thickness is very thin. Roughness, and interface “adhesion” can also been determined.

上一篇颗粒分析+混合氧化石墨烯+分散状态的混合比例

下一篇介孔硅复合材料

文献贡献者