其它null检测 | 介孔硅复合材料-HORIBA（中国）

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应用领域	材料
检测样本	其它
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参考标准	0

Complete characterisation of the composite material structure was successfully carried out using the UVISEL Spectroscopic Phase Modulated Ellipsometer. Accurate and simultaneous determination of thickness, optical properties and anisotropy of the composite porous silica layer has been performed in the NIR/VIS range in order to investigate the nonlinear properties of the material.

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HORIBA UVISEL Plus研究级经典型椭偏仪
型号：UVISEL

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Complete characterisation of the composite material structure was successfully carried out using the UVISEL Spectroscopic Phase Modulated Ellipsometer. Accurate and simultaneous determination of thickness, optical properties and anisotropy of the composite porous silica layer has been performed in the NIR/VIS range in order to investigate the nonlinear properties of the material.

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