其他null检测 | TFT-LCD显示屏-HORIBA（中国）

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应用领域	电子/电气
检测样本	其他
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参考标准	0

Phase Modulated Spectroscopic Ellipsometry is an excellent technique for the highly accurate characterization of complete TFT-LCD device. The technique allows the determination of film thickness, optical properties but also more complex properties such as graded or anisotropic layers and effect of dopants. In the flat panel industry the pressure to reduce manufacturing costs is and reliable metrology tools are required to control the different steps of the process. Spectroscopic ellipsometry is a non destructive technique which presents advanced capabilities and proven reliability tailored for qualification and on-line production control.

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HORIBA UVISEL Plus研究级经典型椭偏仪
型号：UVISEL

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Phase Modulated Spectroscopic Ellipsometry is an excellent technique for the highly accurate characterization of complete TFT-LCD device. The technique allows the determination of film thickness, optical properties but also more complex properties such as graded or anisotropic layers and effect of dopants.

In the flat panel industry the pressure to reduce manufacturing costs is and reliable metrology tools are required to control the different steps of the process. Spectroscopic ellipsometry is a non destructive technique which presents advanced capabilities and proven reliability tailored for qualification and on-line production control.

上一篇颗粒分析+混合氧化石墨烯+分散状态的混合比例

下一篇表征OLED封装器件的厚度和光学常数-研究OLED的老化过程

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