方案摘要
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参考标准 |
The ability of atomic force microscopy (AFM) to create three-dimensional micrographs with nanometer resolution has made it an essential tool in applications ranging from semiconductor processing to biology. In addition to this topographical imaging, the AFM can also probe nanomechanical and other fundamental properties of sample surfaces, including their local adhesive or elastic (compliance) properties.
台阶仪在三维形貌表征领域的应用
3D surface Profi ling applications
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