【求助】基体匹配法

摘　要　用电感耦合等离子发射光谱法( ICP - AES) 直接同时测定焊锡中多种杂质元素
(P ,Fe ,As ,In ,Sb ,Au ,Pb ,Bi ,Cu ,Al ,Ni ,Zn ,Cd) 。在优化仪器的工作条件下,以基体匹配法
配制工作曲线标样,有效地消除基体干扰。方法简便、可靠并得到满意的分析结果。检出
限为0100001 %～010001 % ,回收率在9516 %～105 %范围内,多数分析元素的RSD 小于
5 %。
Abstract 　A method was describeb for simultaneous determination of multi - elements in soldering tin by Inductively
Coupled Plasma Atomic Emission Spectrometry( ICP - AES) in this paper. The operational parameters were optimized ,and
the interference from matrix was eliminated with matrix matching. The satisfactory results were obtained with this simple
and effective method. The detection limit of analytical elements in the soldering tin sample ranged from 0. 00001 % to 0.
0001 % ,the recovery was within the range of 95. 6 % to 105 % ,and the Relative Standard Deviation(RSD) of most ana2
lytical elements was less than 5 %.
基体——matrix