求助：xps测试c1s出现了三个峰，该怎么分析

XPS is a surface analysis technique which detect what presents on the top 10nm of the surface. In this case, samples are easily being oxidized or contaminated in different ways. In your C1s, while the biggest peak which fall around 285eV seems to be a C-C/C-H peak and then indeed there look to be another 2 peaks to the left. They can be C-O, C=O compound or even C-N...etc depending on within your full survey spectrum (full Binding Energy range scan) as what other elements are presented. For example, if O is presented, it could be CO some kinds of bonding compound is/are presenting.

我的也出现这种情况，不知道楼主的联系方式是什么，想请教下啊

三个峰应该是表明C存在三种化学形式，比如碳单键或者碳双建等等或者C-F键等等与其他不同元素成键，有三种不同配位方式，所以有三种不同峰

一般是以284.8ev作为荷电较正，也就是你图中最强峰