magggggg
第2楼2007/04/23
quantitative analysis
The quantative analysis of EDS can be found in the attached file.
The content of the bulk materials is calculted by ZAF method.
It considers the atomic number correction, correction for the absorption and correction for secondary X-ray fluorescence caused by X-rays of heavier elements in he sample. So, we can not judge the relative content by the relative intensities.
dianall
第5楼2007/05/13
===>多层金属膜的厚度只有100nm!所以,本人估计:尽管入射电子束直径只有很小,激发的X射线区域却大得多,所以,在您测量Pt、Au层时,Al层的贡献或受电子束的影响仍然很大,所以,您测量得到的Al的含量可能比实际的要高许多。不是仪器的问题。