小M
第4楼2010/12/29
原来如此啊!
The system supports the user with a wide range of detailed solutions for tasks that could not be adequately performed in the past. The foundation for this achievement has been laid by the Carl Zeiss “Complete Detection System”. This consists of the in-lens SE detector for surface imaging, the in-lens EsB detector for material contrast and the AsB detector for widely dispersed backscattered electrons. The latter contain specific information on the crystal orientation of the sample.
这(指完全检测系统)由用于表面成像的SE探测器、用于材料衬度的EsB探测器和用于广泛分散的背散射电子的AsB探测器组成。后者(指backscattered electrons背散射电子)包含样品晶体取向的特定信息。