资料摘要
资料下载Conductive atomic force microscopy (C-AFM) measurements have been performed on the MDMO-PPV/PCBM system which is potentially interesting for applications as active layer in polymer solar cells (PSCs). It is demonstrated that C-AFM analysis performed in air for ambient conditions provides only inadequate information about the local electrical properties. The main reason is that the samples chemically degrade when in contact with air. Moreover, we speculate that also the adsorbed water layer interferes with reliable nanoscale electrical measurements. In contrast, when performed in inert atmosphere C-AFM analysis offers consistent results of e.g. the I–V characteristics with lateral resolution better than 50 nm, and is able to detect local heterogeneities of these I–V characteristics at the sample surface. 2007 Elsevier B.V. All rights reserved.
MVI Vista-IR 纳米红外成像与光谱
简介:傅立叶变化红外光谱(Fourier Transform infrared spectroscopy, FTIR)广泛应用于各种化学分析,尤其是聚合物和有机化合物分析,为现代化学提供了重要的分析手段。然而常规的傅立叶红外光谱仪由于受到光学衍射极限的限制,其空间分辨率也越来越无法满足科研人员在纳米尺度下对于样品化学分析及成分鉴定。在这一背景下,美国Molecular Vista应运而生,推出了全新一代纳米红外成像与光谱系统Vista-IR!
MVI原子力显微镜与可见-红外-拉曼联用系统
简介:原子力显微镜(Atomic Force Microscope, AFM)经过30多年的发展后,从形貌测试及其它常规功能来看已经非常成熟。然而常规的原子力显微镜也越来越无法满足科研人员在纳米尺度下对于样品进行多性质原位测试分析的更高需求,尤其在化学、光学、电学、热学、力学等领域。在这一背景下,美国Molecular Vista应运而生,推出了全新一代原子力显微镜VistaScope!在具备所有常规原子力显微镜功能的条件下,基于专利的光诱导力显微镜(Photo-induced Force Microscope, PiFM)技术,结合波长可调的可见-红外光源,从而实现10nm以下空间分辨可见~红外成像与光谱采集,无需远场光学接收器及光谱仪。此外,VistaScope原子力显微镜还可以与各类拉曼光谱仪进行联用,组成目前市场上功能最为强大的原子力显微镜与可见-红外-拉曼联用系统,以满足科研人员在纳米尺度下的各种测试需求。
FemtoTools部分产品资料
简介:Femto Tools是瑞士一家专门生产微纳测量和加工仪器的公司,主要的产品有压力传感器探针、纳米移动平台和定位系统、数据采集和控制系统等。产品主要应用于生物与生物工程、材料科学、MEMS 表征、微型机器手臂、纳米技术等。
FemtoTools产品相关介绍
简介: Femto Tools是瑞士一家专门生产微纳测量和加工仪器的公司,主要的产品有压力传感器探针、纳米移动平台和定位系统、数据采集和控制系统等。产品主要应用于生物与生物工程、材料科学、MEMS 表征、微型机器手臂、纳米技术等。
50nm氮化硅薄膜窗口实现原子分辨
简介:Silicon nitride membranes can be used for windows of environmental chambers for in situ electron microscopy.WereportthataberrationcorrectedscanningtransmissionelectronmicroscopySTEM achieved atomic resolution on gold nanoparticles placed on both sides of a 50-nm-thick siliconnitride membrane at 200 keV electron beam energy. Spatial frequencies of 1/1.2 A were visible for a beam semi-angle of 26.5 mrad. Imaging though a 100-nm-thick membrane was also tested. The achieved imaging contrast was evaluated using Monte Carlo simulations of the STEM imaging of a sample of with a representative geometry and composition.
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