Annual Review of Materials Research Vol. 35: 239-314 (Volume publication date August 2005) (doi:10.1146/annurev.matsci.35.102303.091623)
First published online as a Review in Advance on March 17, 2005
ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY
Wilfried Sigle
Max-Planck-Institut für Metallforschung, D-70569 Stuttgart; email: sigle@mf.mpg.de
▪ Abstract Chemical analysis at high spatial resolution is the domain of analytical transmission electron microscopy. Owing to rapid instrumental developments during the past decade, electron energy-loss spectroscopy offers now a spatial resolution close to 0.1 nm and an energy resolution close to 0.1 eV. This development has been accompanied by the introduction of numerous new techniques and methods for data acquisition and analysis, which are outlined in the present article. Recent results for a wide range of material systems are addressed. These comprise first-principles calculations, which have contributed to enormous progress in the calculation of near-edge fine structures, and fingerprinting methods, which are still important for the interpretation of experimental data.
ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY
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