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ICP-OES的干扰论述(USEPA )

ICP光谱

  • 3.1 Spectral interferences are caused by background emission from continuous or
    recombination phenomena, stray light from the line emission of high concentration elements, overlap
    of a spectral line from another element, or unresolved overlap of molecular band spectra.
    3.1.1 Background emission and stray light can usually be compensated for by
    subtracting the background emission determined by measurements adjacent to the analyte
    wavelength peak. Spectral scans of samples or single element solutions in the analyte
    regions may indicate when alternate wavelengths are desirable because of severe spectral
    interference. These scans will also show whether the most appropriate estimate of the
    background emission is provided by an interpolation from measurements on both sides of
    the wavelength peak or by measured emission on only one side. The locations selected for
    the measurement of background intensity will be determined by the complexity of the
    spectrum adjacent to the wavelength peak. The locations used for routine measurement
    must be free of off-line spectral interference (interelement or molecular) or adequately
    corrected to reflect the same change in background intensity as occurs at the wavelength
    peak. For multivariate methods using whole spectral regions, background scans should be
    included in the correction algorithm. Off-line spectral interferences are handled by including
    spectra on interfering species in the algorithm.
    3.1.2 To determine the appropriate location for off-line background correction, the
    user must scan the area on either side adjacent to the wavelength and record the apparent
    emission intensity from all other method analytes. This spectral information must be
    documented and kept on file. The location selected for background correction must be either
    free of off-line interelement spectral interference or a computer routine must be used for
    automatic correction on all determinations. If a wavelength other than the recommended
    wavelength is used, the analyst must determine and document both the overlapping and
    nearby spectral interference effects from all method analytes and common elements and
    provide for their automatic correction on all analyses. Tests to determine spectral
    interference must be done using analyte concentrations that will adequately describe the
    interference. Normally, 100 mg/L single element solutions are sufficient; however, for
    analytes such as iron that may be found at high concentration, a more appropriate test would
    be to use a concentration near the upper analytical range limit.
    3.1.3 Spectral overlaps may be avoided by using an alternate wavelength or can be
    compensated by equations that correct for interelement contributions. Instruments that use
    equations for interelement correction require the interfering elements be analyzed at the
    same time as the element of interest. When operative and uncorrected, interferences will
    produce false positive determinations and be reported as analyte concentrations. More
    extensive information on interferant effects at various wavelengths and resolutions is
    available in reference wavelength tables and books. Users may apply interelementcorrection equations determined on their instruments with tested concentration ranges to
    compensate (off line or on line) for the effects of interfering elements. Some potential
    spectral interferences observed for the recommended wavelengths are given in Table 2. For
    multivariate methods using whole spectral regions, spectral interferences are handled by
    including spectra of the interfering elements in the algorithm. The interferences listed are
    only those that occur between method analytes. Only interferences of a direct overlap nature
    are listed. These overlaps were observed with a single instrument having a working
    resolution of 0.035 nm.
    3.1.4 When using interelement correction equations, the interference may be
    expressed as analyte concentration equivalents (i.e. false analyte concentrations) arising
    from 100 mg/L of the interference element. For example, assume that As is to be
    determined (at 193.696 nm) in a sample containing approximately 10 mg/L of Al. According
    to Table 2, 100 mg/L of Al would yield a false signal for As equivalent to approximately 1.3
    mg/L. Therefore, the presence of 10 mg/L of Al would result in a false signal for As
    equivalent to approximately 0.13 mg/L. The user is cautioned that other instruments may
    exhibit somewhat different levels of interference than those shown in Table 2. The
    interference effects must be evaluated for each individual instrument since the intensities will
    vary.
    3.1.5 Interelement corrections will vary for the same emission line among
    instruments because of differences in resolution, as determined by the grating, the entrance
    and exit slit widths, and by the order of dispersion. Interelement corrections will also vary
    depending upon the choice of background correction points. Selecting a background
    correction point where an interfering emission line may appear should be avoided when
    practical. Interelement corrections that constitute a major portion of an emission signal may
    not yield accurate data. Users should not forget that some samples may contain uncommon
    elements that could contribute spectral interferences.
    3.1.6 The interference effects must be evaluated for each individual instrument
    whether configured as a sequential or simultaneous instrument. For each instrument,
    intensities will vary not only with optical resolution but also with operating conditions (such
    as power, viewing height and argon flow rate). When using the recommended wavelengths,
    the analyst is required to determine and document for each wavelength the effect from
    referenced interferences (Table 2) as well as any other suspected interferences that may be
    specific to the instrument or matrix. The analyst is encouraged to utilize a computer routine
    for automatic correction on all analyses.
    3.1.7 Users of sequential instruments must verify the absence of spectral
    interference by scanning over a range of 0.5 nm centered on the wavelength of interest for
    several samples. The range for lead, for example, would be from 220.6 to 220.1 nm. This
    procedure must be repeated whenever a new matrix is to be analyzed and when a new
    calibration curve using different instrumental conditions is to be prepared. Samples that
    show an elevated background emission across the range may be background corrected by
    applying a correction factor equal to the emission adjacent to the line or at two points on
    either side of the line and interpolating between them. An alternate wavelength that does
    not exhibit a background shift or spectral overlap may also be used.
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  • 第1楼2005/03/14

    3.1.8 If the correction routine is operating properly, the determined apparent
    analyte(s) concentration from analysis of each interference solution should fall within a
    specific concentration range around the calibration blank. The concentration range is
    calculated by multiplying the concentration of the interfering element by the value of the
    correction factor being tested and divided by 10. If after the subtraction of the calibration
    blank the apparent analyte concentration falls outside of this range in either a positive or
    negative direction, a change in the correction factor of more than 10% should be suspected.
    The cause of the change should be determined and corrected and the correction factor
    updated. The interference check solutions should be analyzed more than once to confirm
    a change has occurred. Adequate rinse time between solutions and before analysis of the
    calibration blank will assist in the confirmation.
    3.1.9 When interelement corrections are applied, their accuracy should be verified,
    daily, by analyzing spectral interference check solutions. If the correction factors or
    multivariate correction matrices tested on a daily basis are found to be within the 20% criteria
    for 5 consecutive days, the required verification frequency of those factors in compliance may
    be extended to a weekly basis. Also, if the nature of the samples analyzed is such they do
    not contain concentrations of the interfering elements at ± one reporting limit from zero, daily
    verification is not required. All interelement spectral correction factors or multivariate
    correction matrices must be verified and updated every six months or when an
    instrumentation change, such as in the torch, nebulizer, injector, or plasma conditions
    occurs. Standard solution should be inspected to ensure that there is no contamination that
    may be perceived as a spectral interference.
    3.1.10 When interelement corrections are not used, verification of absence of
    interferences is required.
    3.1.10.1 One method is to use a computer software routine for comparing
    the determinative data to limits files for notifying the analyst when an interfering
    element is detected in the sample at a concentration that will produce either an
    apparent false positive concentration, (i.e., greater than) the analyte instrument
    detection limit, or false negative analyte concentration, (i.e., less than the lower
    control limit of the calibration blank defined for a 99% confidence interval).
    3.1.10.2 Another method is to analyze an Interference Check Solution(s)
    which contains similar concentrations of the major components of the samples (>10
    mg/L) on a continuing basis to verify the absence of effects at the wavelengths
    selected. These data must be kept on file with the sample analysis data. If the
    check solution confirms an operative interference that is > 20% of the analyte
    concentration, the analyte must be determined using (1) analytical and background
    correction wavelengths (or spectral regions) free of the interference, (2) by an
    alternative wavelength, or (3) by another documented test procedure.
    3.2 Physical interferences are effects associated with the sample nebulization and
    transport processes. Changes in viscosity and surface tension can cause significant inaccuracies,
    especially in samples containing high dissolved solids or high acid concentrations. If physical
    interferences are present, they must be reduced by diluting the sample or by using a peristaltic
    pump, by using an internal standard or by using a high solids nebulizer. Another problem that can
    occur with high dissolved solids is salt buildup at the tip of the nebulizer, affecting aerosol flow rateand causing instrumental drift. The problem can be controlled by wetting the argon prior to
    nebulization, using a tip washer, using a high solids nebulizer or diluting the sample. Also, it has
    been reported that better control of the argon flow rate, especially to the nebulizer, improves
    instrument performance: this may be accomplished with the use of mass flow controllers. The test
    described in Section 8.5.1 will help determine if a physical interference is present.
    3.3 Chemical interferences include molecular compound formation, ionization effects, and
    solute vaporization effects. Normally, these effects are not significant with the ICP technique, but
    if observed, can be minimized by careful selection of operating conditions (incident power,
    observation position, and so forth), by buffering of the sample, by matrix matching, and by standard
    addition procedures. Chemical interferences are highly dependent on matrix type and the specific
    analyte element.

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  • 第2楼2005/03/14

    3.4 Memory interferences result when analytes in a previous sample contribute to the
    signals measured in a new sample. Memory effects can result from sample deposition on the uptake
    tubing to the nebulizer and from the build up of sample material in the plasma torch and spray
    chamber. The site where these effects occur is dependent on the element and can be minimized
    by flushing the system with a rinse blank between samples. The possibility of memory interferences
    should be recognized within an analytical run and suitable rinse times should be used to reduce
    them. The rinse times necessary for a particular element must be estimated prior to analysis. This
    may be achieved by aspirating a standard containing elements at a concentration ten times the usual
    amount or at the top of the linear dynamic range. The aspiration time for this sample should be the
    same as a normal sample analysis period, followed by analysis of the rinse blank at designated
    intervals. The length of time required to reduce analyte signals to within a factor of two of the
    method detection limit should be noted. Until the required rinse time is established, this method
    suggests a rinse period of at least 60 seconds between samples and standards. If a memory
    interference is suspected, the sample must be reanalyzed after a rinse period of sufficient length.
    Alternate rinse times may be established by the analyst based upon their DQOs.
    3.5 Users are advised that high salt concentrations can cause analyte signal
    suppressions and confuse interference tests. If the instrument does not display negative values,
    fortify the interference check solution with the elements of interest at 0.5 to 1 mg/L and measure the
    added standard concentration accordingly. Concentrations should be within 20% of the true spiked
    concentration or dilution of the samples will be necessary. In the absence of measurable analyte,
    overcorrection could go undetected if a negative value is reported as zero.
    3.6 The dashes in Table 2 indicate that no measurable interferences were observed even
    at higher interferant concentrations. Generally, interferences were discernible if they produced
    peaks, or background shifts, corresponding to 2 to 5% of the peaks generated by the analyte
    concentrations.

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  • 第4楼2005/03/14

    是不是说的挺详细的?

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  • 第5楼2005/03/14

    俺没那水平,看不懂这些鸟洋文的,给你个建议,是不是作为精华贴还是用国语的好啊,我相信看不懂这些东西的不是一个两个的人吧

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  • 第6楼2005/03/14

    意思我懂,就是翻译不太准,所以就没敢译出来。呵呵,看看有没有高人吧,如果没有人翻的话,我再弄吧,有胜于无不是吗

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  • 第7楼2005/03/15

    俺倒觉得小任的做法是对的,这种文献的东西就该保留原文,好让看的人去理解萁意思,在这里声明并非有卖弄的意思,主要是小任翻译后萁原意可能有变化了,如看不懂可以翻翻字典应能查到!
    小任我支持你一下!

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  • 第9楼2005/03/16

    说实在话,还是看英文的放心

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  • 第10楼2005/03/16

    我也深有同感,所以将原文发上来的

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