" Aberration-corrected ADF-STEM depth sectioning and prospects for reliable 3D imaging in S/TEM " Journal of Electron Microscopy , 58, 157 (2009) paper
xinhuolin发表:" Aberration-corrected ADF-STEM depth sectioning and prospects for reliable 3D imaging in S/TEM " Journal of Electron Microscopy , 58, 157 (2009)